May the force be with you: Detecting ultrafast light by its force – EurekAlert

A McGill research team has developed a new technique to detect nano-sized imperfections in materials. They believe this discovery will lead to improvements in the optical detectors used in a wide range of technologies, from cell phones to cameras and fiber optics, as well as in solar cells.
The researchers, led by Professor Peter Grutter from McGill’s Physics Department, used atomic force microscopy to detect the ultrafast forces that arise when light interacts with matter. In their paper, publ…

Click here to view the original article.