Science
May the force be with you: Detecting ultrafast light by its force – EurekAlert
A McGill research team has developed a new technique to detect nano-sized imperfections in materials. They believe this discovery will lead to improvements in the optical detectors used in a wide range of technologies, from cell phones to cameras and fiber op…
A McGill research team has developed a new technique to detect nano-sized imperfections in materials. They believe this discovery will lead to improvements in the optical detectors used in a wide range of technologies, from cell phones to cameras and fiber optics, as well as in solar cells.
The researchers, led by Professor Peter Grutter from McGill’s Physics Department, used atomic force microscopy to detect the ultrafast forces that arise when light interacts with matter. In their paper, publ…
-
Business21 hours agoIs Warren Buffett’s Berkshire Hathaway the smartest investment you can make today?
-
Noosa News8 hours agoCommissioner thanks police officer who threw a speed radar at a car
-
General22 hours agoTop chess player Magnus Carlsen forced into draw in historic game against over 134,000 people
-
General21 hours agoTaiwan’s President Lai Ching-te calls for peace and dialogue with China while also calling for defence boosts